PBS T CP-0011-XYY Fib Aperture Od Th Fei Acura Focused Ion 50KV Xyy 100UM 2MM 10UM 15UM Beam Vectra 30KV

( Brand: Pbs T ), ( Manufacturer Part Number: CP-0011-XYY ), ( Model: FOR 50KV VECTRA AND 30KV ACURA FIB ), ( Country/region Of Manufacture: United States )

Review PBS T Fib Aperture Disk Od 2mm Th Ch Fei Acura Focused Ion Beam Vectra

FEI Aura FIB-SEM System with 100um Fib Aperture, 2mm Od, 10um-15um Resolution, and Vectra 3D-FEG Column

The FEI Aura Focused Ion Beam-Scanning Electron Microscope (FIB-SEM) system, model 0011, is a high-performance, versatile microscopy tool engineered for advanced materials characterization and nanofabrication. This system, equipped with a specialized 100um fib aperture and a 2mm outer diameter (od), offers exceptional precision and throughput for a wide range of applications.

The 100um fib aperture, a key component of this system, enables deep milling and fast fabrication of large structures while maintaining high-resolution imaging capabilities. The aperture's small dimensions, ranging from 10um to 15um, ensure the system delivers exceptional resolution, facilitating detailed analysis of intricate microstructures.

The FEI Aura system is equipped with a FEI Vectra 3D-FEG column, which employs a 3D-FEG electron source for increased brightness, stability, and spatial resolution. The Vectra column provides unparalleled imaging performance, enabling the system to capture high-resolution images with remarkable clarity and contrast.

In addition to the Vectra column, the system also features a FEI Acura Focused Ion Beam (FIB) column, operating at 50kV and 30kV. The Acura FIB column offers exceptional precision in the deposition and milling of materials, making it ideal for a wide range of nanofabrication tasks. The system's PBS x-y stage ensures smooth and accurate sample positioning, further enhancing the system's overall performance.

In summary, the FEI Aura FIB-SEM system, model 0011, is a state-of-the-art microscopy tool, providing exceptional resolution and precision for materials characterization and nanofabrication tasks. Its advanced features, including the 100um fib aperture, 2mm od, 10um-15um resolution, FEI Vectra 3D-FEG column, and FEI Acura FIB column, make it an indispensable tool for researchers and industry professionals working in the fields of materials science, nanotechnology, and electronics.

Analysis of Fei Aura FIB-SEM System (0011, 50kV Vectra, 30kV PBS XYY) with 100um Fibre Aperture and 2mm OD

1. High Resolution: The Fei Aura FIB-SEM system is equipped with a 100um Fibre Aperture, which allows for high-resolution imaging and analysis of samples at nanoscale levels.

2. Versatility: The system offers two beam energies (50kV and 30kV) and a PBS XYY configuration, providing flexibility for various sample types and analyses.

3. Focused Ion Beam (FIB) Capability: The FIB feature allows for milling, slicing, and deposition of samples, making it a powerful tool for sample preparation and analysis.

4. Durability: Fei is known for manufacturing durable and reliable instruments, ensuring long-term use.

1. High Cost: The Fei Aura FIB-SEM system is a high-end instrument, and its cost may be prohibitive for some research groups or institutions.

2. Complexity: Operating a FIB-SEM system requires specialized training and expertise, which may be a barrier for some users.

3. Maintenance: Due to the delicate nature of the components, regular maintenance and calibration are necessary to ensure optimal performance.

4. Limited Sample Size: The FIB capability is ideal for small sample volumes, which may limit its applicability for larger samples.

The Fei Aura FIB-SEM system with 100um Fibre Aperture, 2mm OD, 50kV Vectra, 30kV PBS XYY is a powerful and versatile instrument for nanoscale analysis and sample preparation. However, its high cost, complexity, maintenance requirements, and limitations on sample size should be carefully considered before making a purchase decision.

For researchers or institutions with a need for high-resolution nanoscale analysis and sample preparation, the Fei Aura FIB-SEM system may be a valuable investment. However, it is recommended to thoroughly evaluate the system's capabilities and costs in relation to the specific research goals and budget constraints to ensure a wise and informed decision. Additionally, considering training and maintenance support from the manufacturer or a third-party service provider may be beneficial.

Details:

This is a third-party component which was not designed, manufactured, verified, or approved by the oem of compatible fib seam equipment.

Brand-new, unused, non-oem consumable aperture disk, od 2mm x th 100UM, ch 10UM - 15UM for micron Jupiter head ion column compatible with 50KV and 30KV focused beam columns.

Multiple item orders may have longer lead times and could ship in parts or from different locations. These aperture disks have outside diameter 2mm, thickness 100UM, central hole in the range from 10UM to 19um.

Ships in membrane box and vacuum-packaged, ready to install.

Compatible with fei vectra vision, v65, 986, acura. They compatible with aperture bar holders for all 40kv and 50KV focused ion beam columns from micron fei companies.

Aperture disks can be ordered from either m - molybdenum or w tungsten material and provide user with unique opportunity to cost effectively build bar replacement create new combinations of sizes beam currents, while saving up us 1000 comparatively oem prices for complete.

part #: cp0011 prices

• $1120.00-$1437.00

specifications microscopepartzo:

• brand: Pbs T
• mpn: Cp-0011-xyy
• model: For 50kv Vectra And 30kv Acura Fib
• country/region of manufacture: United States

Offer microscopepartzo:

• Started: May 20, 2017, 6:49 pm
• best offer: false
• quantity: 10
• Sold: 0
• bids: 0

Returns microscopepartzo:

• policy: no returns

Seller microscopepartzo:

• zipcode: 01844
• city: Methuen, Massachusetts

Shipping microscopepartzo:

• cost: $20.0
• type: Flat
• handling: 5 days

General microscopepartzo:

• business industrial > healthcare lab life science lab equipment business industrial > microscope parts lab equipment
• in stock: Yes
• condition: New other see details

Payments microscopepartzo:

• PayPal

Ratings:

1. GOOD 02-12-17
2. smooth transaction A 05-17-17
3. Great ! Thanks, 5 stars 01-26-17
4. Good buyer, prompt payment, valued customer, highly recommended. 02-05-17
5. Thank you! 04-15-17