NANOSCIENCE VISTAPROBES T300R-10 Silicon Afm Probes Contact 40 N/m

( Brand: Nanoscience Vistaprobes ), ( Manufacturer Part Number: T300R-10 ), ( Part Type: Probe )

Review NANOSCIENCE VISTAPROBES Lot Of Silicon Afm Probes Non Contact 40 N/m

Nanoscience Vistaprobes T300R-10 Silicon AFM Probes (Contact, 40 n/m) - Precision and Reliability in Nanoscale Exploration

Embark on an extraordinary journey into the microscopic world with the Nanoscience Vistaprobes T300R-10 Silicon AFM Probes. These probes, designed for contact mode operation, are the epitome of precision and reliability, ideal for investigating the intricate details of surfaces at the nanoscale.

Crafted from high-quality silicon, the T300R-10 probes boast a force constant of 40 n/m, granting you the ability to maintain a delicate balance between force and resolution during your scanning process. This force constant is perfectly suited for a wide range of materials, providing versatility in your investigations.

The T300R-10 probes belong to the Vistaprobe series, renowned for their exceptional quality and consistency. With a robust design and exquisite attention to detail, these probes are engineered to withstand the rigors of day-to-day use in a research environment.

Each T300R-10 probe is delivered as part of a set of ten, ensuring you have ample supply for your experiments. This set provides an economical solution for maintaining a steady workflow, enabling you to switch probes when needed, helping to prolong the life of your AFM tip and achieve optimal results.

Incorporate the Nanoscience Vistaprobes T300R-10 Silicon AFM Probes into your arsenal and unlock the mysteries of the nanoscale. With their exceptional performance, durability, and versatility, these probes are the perfect companion for your Atomic Force Microscopy (AFM) endeavors. Experience the difference that precision and reliability can make in your research and elevate your nanoscale explorations to new heights.

1. High-quality silicon probes: These probes are made of high-quality silicon, which is known for its stability and compatibility with various samples.

2. Contact mode operation: The contact mode operation allows for reliable and accurate measurements, especially for hard and conductive samples.

3. Spring constant of 40 n/m: This spring constant provides a good balance between imaging speed and sample displacement, making it suitable for a wide range of applications.

4. Large probe tip radius: The large probe tip radius reduces the risk of damage to soft samples.

5. Reusable: These probes can be reused multiple times, making them a cost-effective choice in the long run.

1. Lack of versatility: Since these probes are designed for contact mode operation, they may not be suitable for all types of samples or applications that require other modes such as non-contact or tapping mode.

2. Limited feedback: The contact mode operation does not provide real-time feedback on the sample's mechanical properties like other modes do.

3. Potential tip wear: Due to the contact between the probe and the sample, there is a higher risk of tip wear over time, which may affect the quality of the images.

4. Higher force on the sample: The 40 n/m spring constant applies a higher force on the sample compared to probes with lower spring constants, which could potentially damage delicate samples.

Conclusion: Nanoscience Vistaprobes T300R-10 Silicon AFM Probes (Contact 40 n/m) are a good choice if you require a stable, reusable probe for hard and conductive samples, and if you are primarily working in contact mode. However, if you need a probe for a wider range of applications or softer samples, you may want to consider probes with different tip radii, spring constants, or modes of operation.

Recommendation: If you are looking for a high-quality, reusable probe for contact mode AFM work on hard and conductive samples, the Nanoscience Vistaprobes T300R-10 Silicon AFM Probes (Contact 40 n/m) could be a good investment. However, it's always a good idea to research and compare different probes based on your specific needs and requirements.

Details:

Exactly what is pictured included. LOT OF VISTAPROBES NANOSCIENCE SILICON AFM PROBES T300R-10 NON CONTACT 40 N/M: images. Please examine pictures for the cosmetic condition. Item condition: THIS IS FOR THE LOT PICTURED, THEY CAME WITH A ATM MICROSCOPE I PURCHASED.

Our primary carriers are USPS and FEDEX. Please look at the pictures for exact cosmetic condition.

specifications microscopepartzo:

• brand: Nanoscience Vistaprobes
• mpn: T300r-10
• part type: Probe

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returns microscopepartzo:

• method: Money back
• paid by: Buyer
• time: 30 Days
• policy: Returns Accepted

seller microscopepartzo:

• rating: 99.0%
• # reviews: 17010
• city: Des Moines, Iowa

shipping microscopepartzo:

• transit: 3-7 Days
• service: Expedited
• type: Fixed
• cost: $5.99
• class: Expedited

offer microscopepartzo:

• options: Ship-to-home
• availability: In Stock
• started: February 17, 2025
• sold: 0
• quantity: 1

general microscopepartzo:

• condition: Used
• Medical/Lab Equipment Attachments Accessories > Microscope Parts Accessories > Other Microscope Parts Accessories

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• Nanoscience Vistaprobes Rap300e-g Mixed Lot Of Budget Sensors Tap300e-g Multi75a Conte-g Silicon Afm Probes Rare (59.3% similar) Exactly what is pictured included. Our primary carriers are USPS and FedEx. Please examine pictures for the cosmetic condition. Item condition: this is for the lot pictured, they came with a ATM microscope I purchased. Please look at the pictures for exact cosmetic condition. Mixed lot of budget ...(February 19th, 2025)