1. Microscope Parts Lab Equipment For Sale
  2. sku: 12287482520316793
  3. MULTI PROBE AFP-065

MULTI PROBE AFP-065 Atomic Force Microscope Probes 3X 5X 100NM

Afp-065 Multi Probe 8 Atomic Force Microscope Probes W Cases 3x 5x 100nm

( Brand: Multi Probe ), ( Manufacturer Part Number: AFP-065 ), ( Part Type: Probe Case )

Review MULTI PROBE Atomic Force Microscope Probes Cases 3x 5x 100nm

The **Probe AFP-065 Atomic Force Microscope (AFM) Probes**, engineered with precision for high-resolution nanoscale imaging and characterization, represent a cutting-edge solution for researchers and scientists seeking unparalleled surface analysis capabilities. These probes are meticulously crafted to deliver exceptional performance in tapping mode, contact mode, and other dynamic AFM techniques, making them ideal for applications in materials science, biology, semiconductor research, and nanotechnology. With a uniquely tapered silicon cantilever featuring a sharp, well-defined tip geometry of **3 5 100 nanometers**, these probes ensure minimal tip-sample interaction while maximizing lateral resolution, enabling the visualization of fine structural details at the atomic or near-atomic level. The cantilever itself is designed with a resonant frequency typically ranging between **65 100 kHz**, providing stability and sensitivity during high-speed scanning operations. Constructed from high-purity silicon, the probes exhibit excellent mechanical stiffness and thermal stability, ensuring consistent performance across a wide range of environmental conditions, from ambient to controlled vacuum or liquid environments. The reflective gold coating on the backside of the cantilever enhances optical detection efficiency, allowing for precise deflection measurements via laser beam deflection systems, while the low force constant (typically **0.2 0.6 N/m**) minimizes sample perturbation, making them particularly suitable for delicate biological samples or soft materials. Whether used for topographical mapping, phase imaging, or force spectroscopy, these AFM probes deliver reliable, high-fidelity data with exceptional reproducibility, empowering researchers to push the boundaries of nanoscale exploration. Their robust yet precise design ensures compatibility with a broad spectrum of AFM systems, making them a versatile and indispensable tool for advancing scientific discovery in cutting-edge fields.

**Pros and Cons of buying a ProbeAFP-065 Atomic Force Microscope (AFM) Probes (3 m 5 m 100 nm)**

### **Pros**

1. **High Resolution and Sensitivity**

The AFP-065 probes are designed for high-resolution imaging and force measurements, making them suitable for nanoscale applications. Their small tip radius (100 nm) enhances spatial resolution, allowing detailed surface characterization.

2. **Versatility in AFM Modes**

These probes are compatible with multiple AFM operation modes, including contact mode, tapping mode (intermittent contact), and force spectroscopy. This flexibility makes them adaptable to various sample types, from soft biological materials to hard inorganic surfaces.

3. **Durability and Stability**

The silicon-based cantilevers are known for their mechanical robustness, reducing the risk of tip damage during scanning. The triangular shape and high aspect ratio (3 m 5 m) provide stability during lateral force measurements and high-force applications.

4. **Optimized for Force Measurements**

The probes feature a low spring constant (typically in the range of 0.1 1 N/m), which is ideal for precise force-distance curve measurements. This is particularly useful in studies involving material deformation, adhesion, and mechanical properties.

5. **Compatibility with Standard AFM Systems**

These probes are designed to fit standard AFM heads and scanners, ensuring compatibility with most commercial AFM setups. This reduces the need for additional modifications or adapters.

6. **Cost-Effective for High-End Applications**

While AFM probes can be expensive, the AFP-065 series offers a balance between performance and cost for researchers working on mid-to-high-budget projects. They are often more affordable than high-end probes with even smaller tips (e.g.,

7. **Widely Available and Supported**

ProbeAFM is a reputable manufacturer, and these probes come with technical support, calibration data, and documentation. This ensures easier troubleshooting and optimization of AFM experiments.

---

### **Cons**

1. **Limited Tip Sharpness for Ultra-High Resolution**

While the 100 nm tip radius is suitable for many applications, it may not be sufficient for imaging features smaller than 50 nm with high precision. For sub-10 nm resolution, sharper tips (e.g.,

2. **Potential for Tip Contamination or Wear**

Silicon probes can suffer from tip contamination (e.g., from sample debris or environmental particles) or wear over time, especially when scanning rough or abrasive surfaces. This may necessitate frequent tip replacement, increasing long-term costs.

3. **Spring Constant Limitations**

The low spring constant of these probes (often

4. **Compatibility Issues with Some AFM Setups**

While generally compatible, some older or non-standard AFM systems might require additional adapters or modifications to accommodate the probe dimensions. Always verify compatibility before purchase.

5. **Cost of Replacement Probes**

AFM probes are consumable items, and frequent replacements can add up. For high-throughput or long-term projects, the cumulative cost of probe consumption may be significant.

6. **Learning Curve for Optimization**

Achieving optimal performance with these probes requires experience in tuning AFM parameters (e.g., setpoint, scan rate, and feedback gain). Inexperienced users may struggle initially with obtaining high-quality images or reliable force measurements.

7. **Environmental Sensitivity**

Silicon probes can be sensitive to humidity and temperature fluctuations, which may affect their performance. Controlled environments (e.g., clean rooms or climate-controlled chambers) are often necessary for consistent results.

---

### **Conclusion**

The **ProbeAFP-065 AFM probes (3 m 5 m 100 nm)** are a strong choice for researchers and laboratories requiring **high-resolution imaging, force spectroscopy, and versatility across multiple AFM modes**. Their **durability, compatibility with standard systems, and optimized spring constants** make them well-suited for a wide range of applications, from material science to biology. However, their **limited tip sharpness for ultra-high resolution, sensitivity to contamination, and potential vibration issues** may pose challenges depending on the specific requirements of the project.

For **general-purpose AFM work, force measurements, and mid-resolution imaging**, these probes are an excellent investment. If **sub-50 nm resolution is critical**, users may need to supplement them with sharper tips or consider alternative probe types. Additionally, **investing in a stable AFM environment and vibration isolation** will enhance their performance.

---

### **Recommendation**

- **Buy the AFP-065 probes if:**

- You need **reliable, high-resolution imaging (down to 50 nm)** and force measurements.

- Your AFM setup is **standard and compatible** with triangular silicon cantilevers.

- You work in **materials science, surface chemistry, or biological studies** where moderate tip sharpness is sufficient.

- You require **versatility across contact, tapping, and force spectroscopy modes**.

- You have access to **controlled environments** to minimize contamination and vibration.

- **Consider alternatives if:**

- You require **sub-20 nm resolution**, in which case **sharper tips (e.g.,

- Your samples are **extremely soft or delicate**, and you need **ultra-low spring constant probes** (

- Your AFM system is **non-standard**, and you must verify probe compatibility beforehand.

- You operate in a **high-vibration environment**, and you lack proper isolation systems.

For most **researchers and academic labs** with moderate to high AFM demands, the **AFP-065 probes offer an excellent balance of performance and cost-effectiveness**. Pairing them with **proper calibration, environmental control, and regular tip maintenance** will maximize their utility.

Details:

Buyer pays for shipping SEE BELOW. Good cosmetic condition. Guaranteed to be working perfectly. GSR veers 1730 GS 9.9.4 1730 11 AFP Probes in original cases.

30 day return warranty.

part #: afp065 price

  • $84.28

specifications microscopepartzo:

  • brand: Multi Probe
  • mpn: Afp-065
  • part type: Probe Case

general microscopepartzo:

  • Medical/Lab Equipment Attachments Accessories > Microscope Parts Accessories > Other Microscope Parts Accessories
  • condition: Used

returns microscopepartzo:

  • paid by: Buyer
  • policy: Returns Accepted
  • time: 30 Days
  • method: Money back

offer microscopepartzo:

  • sold: 0
  • availability: In Stock
  • options: Ship-to-home
  • started: February 15, 2026
  • quantity: 1
  • best offers: True

seller microscopepartzo:

  • # reviews: 9168
  • rating: 100.0%
  • city: Petaluma, California

payments microscopepartzo:

  • credit card: Visa
  • wallet: Paypal
  • other

shipping microscopepartzo:

  • service: UPS Ground
  • cost: $12.00
  • transit: 4-8 Days
  • class: Standard
  • carrier: UPS
  • type: Fixed
part type: probe case,
category: business & industrial > medical/lab equipment attachments accessories > microscope parts accessories, sku: 12287482520316793,
Multi Probe AFP-065 Is Similar To:
microscopepartzo logo
1 offer $84.28 USD
  • Used. Offer #1 priced at $84.28 + $104.24 shipping estimate = $188.52* total. South Korea Item ID: 876.+$104.24 shipping

Copyright © microscopepartzo.net